FHG_ROMBIST

Purpose

The FHG_ROMBIST is a ROM architecture and technology independent Built In Self Test Controller for Read Only Memories (ROM). Its parameter set enables the designer to tailor the ROM BIST to the applications needs.

Features

• Fully static, synthesizable ROM BIST
• ROM Structure independent CRC Algorithms
• Master Slave, simultaneous multiple ROM Test
• Optional transparent Bypass Mode (hidden ROM test during scan test)
• Optional Zero Output
• BIST Logic Scan testable
• JTAG controllable
• Technology independent (FPGA and ASIC)

Documentation

Please ask for details.

Design Kit

• Technology Independent Implementation as Synopsys Design Ware Components
• VHDL/Verilog Simulation Models
• VHDL/Verilog Compliance Test Suite
• Synthesis and Testsynthesis Scripts

Design Support, Netlist Synthesis Service and Consulting available.

Requirements

• Simulation
  • VHDL IEEE-1076 Simulator
  • Verilog IEEE-1364 Simulator
• Synthesis
  • Synopsys Design Compiler

Terms & Conditions

Details